about us

About Everred

Ever Red New technology company (Everred) is a Taiwan automated optical Inspection manufacturer which owns cutting-edge design capabilities in combining 2D/2.5D/3D optical, mechanical, electronic, software and information & communication technology (ICT) core technologies to develop high-quality products and diversified services for customers. Everred’s vision is to design and deliver products that help our valued customers grow their business, boost quality, and deepen their customer relationships. Our products are applied in semiconductor Fab. , semiconductor PKG, LED, silicon chip, fiber-optic communication, laser diode, filter, ceramic substrate, o-ring and etc.

  • Semiconductor Fab.
  • Semiconductor PKG
  • LED and Silicon Chip
  • Fiber-optic Communication
  • Laser Diode
  • Ceramic substrate
  • O-ring
  • Milestone

    2019

  • Launched AI color inspection solution
  • 2018

  • Launched Photo Diode 4-sided Inspection System and sorter
  • Introduction of 3D Bumping Inspection technology
  • 2017

  • Launched 2D/3D wafer Inspection system (8”~12”)
  • Introduction of W/B and D/B nspection system
  • 2016

  • Announced polish pad 3D inspection system
  • Introduction of tape to reel 5S inspection system and Sorter
  • 2015

  • Launched 2D wafer Inspection system (6”~8”)
  • Leveraged our strategic partners, Sristc Technology, to develop Industry 4.0
  • 2014

  • Introduced automated defection system with Laser marking technology
  • Invited as a represented member of Korea-Busan advanced semiconductor association (전력반도체산업)
  • Launched the first defect inspection system and sorter for optic communication
  • 2013

  • Initial development of 6“~8” automated macro defect inspection system designed for semiconductor
  • 2012

  • Announced 2”~4” defect inspection system for PSS, Mask, Epi
  • 2011

  • Introduction of the second-generation defect inspection system for LED
  • 2010

  • Launched the first defect inspection system for O-Ring in Taiwan
  • Designed the defect inspection system for Passive Component
  • 2009

  • Launched the first defect inspection system for LED
  • Introduction of advanced US NASA Mura technology
  • 2008

  • Established in July
  • Core members from Industrial Technology Research Institute
  • gallery